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| 1988 || || {{w|Alfred Cerezo}}, {{w|Terence Godfrey}}, and {{w|George D. W. Smith}} invent the {{w|atom probe}} tomograph, making it able to resolve materials in 3-dimensions with near-atomic resolution.<ref>{{cite web |title=Some atoms I have known - origins, development and applications of atom probe tomography |url=https://podcasts.ox.ac.uk/some-atoms-i-have-known-origins-development-and-applications-atom-probe-tomography |website=ox.ac.uk |accessdate=30 January 2019}}</ref><ref>{{cite web |title=Progress in the Atomic-Scale Analysis of Materials with the Three-Dimensional Atom Probe |url=https://www.researchgate.net/publication/242781581_Progress_in_the_Atomic-Scale_Analysis_of_Materials_with_the_Three-Dimensional_Atom_Probe |website=researchgate.net |accessdate=30 January 2019}}</ref><ref>{{cite web |title=Some atoms I have known - origins, development and applications of atom probe tomography |url=https://player.fm/series/department-of-materials/some-atoms-i-have-known-origins-development-and-applications-of-atom-probe-tomography |website=player.fm |accessdate=30 January 2019}}</ref> ||
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| 1988 || || "Japanese scientist {{w|Kingo Itaya }} invents the [[Electrochemical {{w|electrochemical scanning tunneling microscope]]Kingo Itaya invents the [[Electrochemical scanning tunneling microscope]]" }}. ||
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| 1991 || || The {{w|Kelvin probe force microscope}} is invented.<ref>{{cite book |last1=Sadewasser |first1=Sascha |last2=Glatzel |first2=Thilo |title=Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization |url=https://books.google.com.ar/books?id=C5BQDwAAQBAJ&pg=PA48&dq=1991+Kelvin+probe+force+microscope&hl=en&sa=X&ved=0ahUKEwizkNu7zpDgAhXPE7kGHaQtBXIQ6AEIKTAA#v=onepage&q=1991%20Kelvin%20probe%20force%20microscope&f=false}}</ref><ref>{{cite book |last1=Vilarinho |first1=Paula Maria |last2=Rosenwaks |first2=Yossi |last3=Kingon |first3=Angus |title=Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 |url=https://books.google.com.ar/books?id=SPfvTcK3CH0C&pg=PA150&dq=1991+Kelvin+probe+force+microscope&hl=en&sa=X&ved=0ahUKEwizkNu7zpDgAhXPE7kGHaQtBXIQ6AEILjAB#v=onepage&q=1991%20Kelvin%20probe%20force%20microscope&f=false}}</ref><ref>{{cite book |last1=Lanza |first1=Mario |title=Conductive Atomic Force Microscopy: Applications in Nanomaterials |url=https://books.google.com.ar/books?id=_EozDwAAQBAJ&pg=PA312&dq=1991+Kelvin+probe+force+microscope&hl=en&sa=X&ved=0ahUKEwizkNu7zpDgAhXPE7kGHaQtBXIQ6AEIMjAC#v=onepage&q=1991%20Kelvin%20probe%20force%20microscope&f=false}}</ref> ||
